Logo
International Journal of
Advanced Science and Research
ARCHIVES
VOL. 2, ISSUE 4 (2017)
Growth and electrical characterization of zinc sulphide thin films
Authors
Syed Ghause Ibrahim
Abstract
Nanostructured zinc sulphide thin films were deposited onto glass substrates by using chemical spray pyrolysis deposition method at 673 K and the electrical properties of the as deposited thin films were investigated. In order to determine the electrical characterization, the resistivity measurements of the films were performed by using two-probe method. The optical band gap of the deposited film was found to be 3.51eV. The electrical resistivity of zinc sulphide thin films was found to be of the order of 105 Ωcm. The thermo-emf measurement confirms that zinc sulphide thin films have n-type conductivity.
Download
Pages:29-30
How to cite this article:
Syed Ghause Ibrahim "Growth and electrical characterization of zinc sulphide thin films". International Journal of Advanced Science and Research, Vol 2, Issue 4, 2017, Pages 29-30
Download Author Certificate

Please enter the email address corresponding to this article submission to download your certificate.